Analysis and mapping of detailed inner information of crystalline grain by wavelength-resolved neutron transmission imaging with individual Bragg-dip profile-fitting analysis

櫻井 洋亮*; 佐藤 博隆*; 足立 望*; 諸岡 聡; 戸高 義一*; 加美山 隆*

Applied Sciences (Internet), 11(11), p.5219_1 - 5219_17, 2021/06

https://doi.org/10.3390/app11115219

As a new method for evaluating single crystal and oligocrystal, pulsed neutron Bragg-dip transmission analysis/imaging method is being developed. In this study, a single Bragg-dip profile fitting analysis method was newly developed, and applied for analyzing detailed inner information in a crystalline grain position-dependently. In the method, the spectrum profile of a single Bragg-dip is analyzed at each position over a grain. As a result, it is expected that changes of crystal orientation, mosaic spread angle and thickness of a perfect crystal can be evaluated from the wavelength, the width and the integrated intensity of the Bragg-dip, respectively. For confirming this effectiveness, the method was applied to experimental data of position-dependent Bragg-dip transmission spectra of a Si-steel plate consisting of oligocrystals. As a result, inner information of multiple crystalline grains could be visualized and evaluated. The small change of crystal orientation in a grain, about 0.4, could be observed by imaging the Bragg-dip wavelengths. By imaging the Bragg-dip widths, both another grain and mosaic block in a grain were detected. Furthermore, imaging results of the integrated intensities of Bragg-dips were consistent with the results of Bragg-dip width imaging. These small crystallographic changes have not been observed and visualized by previous Bragg-dip analysis methods.